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Method and apparatus for radiation analysis and encoder

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate

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Method and apparatus for radiation encoding an analysis

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
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Method and apparatus for radiation encoding and analysis

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
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Method and apparatus for spectrum analysis and encoder

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
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Method and apparatus for spectrum analysis and encoder

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate

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Method and apparatus for spectrum analysis and encoder

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
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Method and apparatus for spectrum analysis and encoder

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
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Multiplex spectroscopy

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Multiplex spectroscopy

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Programmable standard for use in an apparatus and process for th

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Real time optical pre-detection processing of multispectral imag

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Single Hadamard mask spectrograph system

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Spatial radiation modulator pattern generation

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate

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Spectral analysis of a beam of radiation

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Spectral filter

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Spectrometers

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Static two-dimensional aperture coding for multimodal...

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate

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Stationary, electrically alterable, optical masking device and s

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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Stationary, electrically alterable, optical masking device and s

Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent

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