Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate
2007-11-27
2007-11-27
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
C356S328000, C356S330000
Reexamination Certificate
active
11334546
ABSTRACT:
A class of aperture coded spectrometer is optimized for the spectral characterization of diffuse sources. The instrument achieves high throughput and high spatial resolution by replacing the slit of conventional dispersive spectrometers with a spatial filter or mask. A number of masks can be used including Harmonic masks, Legendre masks, and Hadamard masks.
REFERENCES:
patent: 5627639 (1997-05-01), Mende et al.
patent: 7092101 (2006-08-01), Brady et al.
patent: 7180588 (2007-02-01), Geshwind et al.
patent: 2006/0092414 (2006-05-01), Geshwind et al.
Mende et al., Hadamard sprectroscopy with a two-dimensional detecting array, Applied Optics, vol. 32, No. 34, Dec. 1, 1993.
Brady David
Gehm Michael E.
McCain Scott T.
Potuluri Prasant
Sullivan Michael E.
Duke University
Evans F. L.
Kasha John R.
Kasha Law PLLC
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