Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate
2006-02-07
2006-02-07
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
Reexamination Certificate
active
06995840
ABSTRACT:
Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.
REFERENCES:
patent: 3720469 (1973-03-01), Harwit
patent: 3922092 (1975-11-01), van den Bosch
patent: 5090807 (1992-02-01), Tai
patent: 5483335 (1996-01-01), Tobias
patent: 5485268 (1996-01-01), Tobias
patent: 6128078 (2000-10-01), Fateley
patent: 6859275 (2005-02-01), Fateley et al.
“Notification of Transmittal of the International Search Report or the Declaration”, corresponding PCT application No. PCT/US03.07369, International Searching Authority, United States Patent Office, Jun. 3, 2003, 6 pages.
Aspectrics, Inc.
Fenwick & West LLP
Geisel Kara
Toatley , Jr. Gregory J.
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