Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent
1981-04-13
1984-05-15
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
250281, 356326, 378 82, G01J 328
Patent
active
044485298
ABSTRACT:
Spectral analysis of a beam of radiation is carried out by splitting the beam of radiation into its respective spectral components and by applying a characteristic modulation to each of the spectral components before allowing them to fall on a common detector. The super-imposed signals generated by the detector and representative of the spectral components are then electronically segregated by reference to the characteristic modulations that have been applied to the individual spectral components. This is conveniently done by generating a series of modulated reference signals which have been modulated in exactly the same way as the spectral components of interest. The technique is not restricted to optical spectra but can also be used, for example, for X-ray spectra and mass spectra.
REFERENCES:
patent: 3151247 (1964-09-01), Auvermann
patent: 3640625 (1972-02-01), Ibbett et al.
patent: 3720469 (1973-03-01), Harwit
Marcel J. E. Golay "Multi-Slit Spectrometry", Journal of the Optical Society of America, vol. 39, No. 6, pp. 437-444; Jun. 1949.
R. N. Ibbett, et al., "Real-Time Multiplexing of Dispersed Spectra in any Wave-Length Region", Applied Optics, vol. 7, No. 6, pp. 1089-1093, Jun. 1968.
John A. Decker, et al., "Sequential Encoding with Multislit Spectrometers" Applied Optics, vol. 7, No. 11, pp. 2205-2209 Nov., 1968.
Erwin Sick GmbH - Optik-Elektronik
Evans F. L.
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