Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent
1989-09-21
1991-09-24
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
356330, G01J 306, G01J 336
Patent
active
050509896
ABSTRACT:
A Hadamard mask is placed in the entrance plane of a standard flat field grating spectrograph. A planar array is used as the detector. The Hadamard mask contains 2n-1 elements, where n is the number of elements in the detector array. This configuration produces a spectrograph with a wide aperture and hence high throughput, and allows rapid spectral measurements with no moving parts. It also allows simultaneous measurement of a randomly occurring pulse source.
REFERENCES:
patent: 3578980 (1971-05-01), Decker, Jr. et al.
patent: 3859515 (1975-01-01), Radcliffe, Jr.
patent: 3955891 (1976-05-01), Knight et al.
patent: 4007989 (1977-02-01), Wajda
patent: 4435838 (1984-03-01), Gourlay
patent: 4442454 (1984-04-01), Powell
patent: 4580162 (1986-04-01), Mori
Harwit et al., "Doubly Multiplexed Dispersive Spectrometers", Applied Optics, vol. 9, No. 5, May 1970, pp. 1149-1154.
Van Tassel Roger A.
Wong Wallace K.
Auton William G.
McGraw Vincent P.
Singer Donald J.
The United States of America as represented by the Secretary of
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