Search
Selected: D

Determining optical signal transit delay time in an optical inte

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Determining the complex refractive index phase offset in interfe

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for reducing angular random walk in a ring las

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for spectroscopic measurement with an...

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for testing the wave front quality of optical

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for three-dimensional measurements and observa

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for time-resolved optical measurements

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and process for measuring two opposite surfaces of a body

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for analyzing and correcting wavefront surfaces in real t

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for analyzing and correcting wavefront surfaces in real t

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for and method of measuring absolute rotations in several

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for automatically evaluating a plurality of probe ingredi

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for detecting positional relationship between two objects

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for determining or stabilizing the wavelength of laser li

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for determining the amplitude of the spectral lines in th

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for determining the shape of the wave surface reflected b

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for determining the shape of the wave surface transmitted

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for efficient light collection from a sample

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for establishing a condition at the surface of a subject

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for interferometric measurements with compensation for ti

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.