Device for analyzing and correcting wavefront surfaces in real t

Details Device for analyzing and correcting wavefront surfaces in real t Device for analyzing and correcting wavefront surfaces in real t

1985-05-08

1987-02-24

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

046453466

ABSTRACT:
An optical system for analyzing and correcting distorted wavefronts comprising a deformable mirror for correcting said wavefronts; a system for analyzing and detecting phase distortions; an interferometer with lateral shearing constituting the analyzing and detecting system, for receiving the distorted wavefront for analysis, and for duplicating it and deducing from two neighboring points of the wavefront thus obtained signals for controlling deformation of said deformable mirror, wherein the interferometer with lateral shearing is formed of two 90.degree. reflecting dihedrons, the bisecting lines of which cross at the center of the interferometer, and one of the dihedrons can be moved through a predetermined distance parallel to the bisecting plane of the other, the other dihedron being vibrated cyclically parallel with its own bisecting plane.

REFERENCES:
patent: 3825348 (1974-07-01), Nomarski et al.
Marty et al., "Radial Shearing Interferometers Using a Laser Source", Applied Optics, vol. 12, No. 11, pp. 2765-2767, 11/73.
Roddier et al., "A Rotation Shearing Interferometer with Phase-Compensated Roof-Prisms, J. Optics, vol. 9, No. 3, pp. 145-149 6/78.

Affiliated with

Also associated with

Rating

Device for analyzing and correcting wavefront surfaces in real t does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device for analyzing and correcting wavefront surfaces in real t, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for analyzing and correcting wavefront surfaces in real t will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-106393