Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-06-24
1998-11-10
Kim, Robert
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356360, G01B 902
Patent
active
058352198
ABSTRACT:
The present invention relates to a device for determining the shape of the wave surface transmitted by a substantially parallel-faced transparent component (P), which includes a support (S) for the component (P), an interferometer (I), means for moving the support (S), and a control unit which determines, from the measurements by the interferometer (I), the shape of said wave surface. According to the invention, the support (S) is made in such a way as to let the light beam (FM) emitted by the interferometer (I) and transmitted by the component (P), which is transparent, pass through it, and said device includes a swivelling mirror (M1) arranged approximately orthogonally to the beam (FM) transmitted by the component and oriented in such a way as to send said beam (FM) back in the emission direction (D1).
REFERENCES:
patent: 3338130 (1967-08-01), Gaffard
patent: 4792228 (1988-12-01), Haffner
patent: 5337140 (1994-08-01), Hagiwara et al.
patent: 5343410 (1994-08-01), Tsujiuchi et al.
patent: 5473435 (1995-12-01), Masuyuki et al.
patent: 5488477 (1996-01-01), De Groot
French Search Report, 3 pages, dated Mar. 4, 1997.
Compagnie Industrielle des Lasers Cilas
Kim Robert
Le Commissariat A L'Energie Atomique
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