Device for analyzing and correcting wavefront surfaces in real t

Details Device for analyzing and correcting wavefront surfaces in real t Device for analyzing and correcting wavefront surfaces in real t

1985-06-11

1987-08-25

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356353, G01B 902

Patent

active

046889418

ABSTRACT:
An optical system for analyzing and correcting wave fronts comprising a deformable mirror for correcting wave fronts and a system for analyzing and detecting phase distortion, an interferometer with lateral duplication constituting the analysis system, receiving the wave front for analysis and duplicating it and deducing from two neighboring wave fronts obtained signals to control deformation of the deformable mirror, wherein this lateral duplication interferometer is a polarization interferometer consisting of a Wollaston double-refractive biprism with an angle .theta., the two prisms being assembled head to tail and cut parallel to the crystallographic axis such that the respective axes are parallel and perpendicular to the edges of the prisms, a polarizer and an analyzer on either side of the biprism and an oscillating optical member on the path of the biprism.

REFERENCES:
patent: 3849001 (1974-11-01), Inoue et al.
patent: 3923400 (1975-12-01), Hardy
patent: 4003658 (1977-01-01), Kelsall
patent: 4072422 (1978-02-01), Tanaka et al.
"The Elimination of Signal Fading in Homodyne Interferometric Sensors Using Passive Compensation", Kersey et al., Conference: Collognium on Optical Fiber Sensors, May 1982.

Affiliated with

Also associated with

Rating

Device for analyzing and correcting wavefront surfaces in real t does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device for analyzing and correcting wavefront surfaces in real t, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for analyzing and correcting wavefront surfaces in real t will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1920451