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Selected: P

Probe device

Image analysis – Applications – Manufacturing or product inspection
Patent

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Probe mark inspection method and apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Process and apparatus for automatically characterizing, optimizi

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process and apparatus for examining optical components,...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Process and apparatus for locating coated cooling holes on...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Process and device for generating test patterns when...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Process control using multiple detections

Image analysis – Applications – Manufacturing or product inspection
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Process for automatic detection of the assessable areas in image

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for checking a laser weld seam

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Process for detecting and mapping dirt on the surface of a photo

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for inspecting an object

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Process for inspecting metallic chips fragments in order to elim

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for measuring the optical quality of a glass product

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for positioning of a mask relative to another mask, or m

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for producing a synthesized reference image for the insp

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for the automatic detection of defects in mechanical par

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for the positioning of a mask relative to a workpiece an

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for the removal of multi-trip bottles from circulation

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process for three dimensional inspection of electronic component

Image analysis – Applications – Manufacturing or product inspection
Patent

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Process inspection using full and segment waveform matching

Image analysis – Applications – Manufacturing or product inspection
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