Image analysis – Applications – Manufacturing or product inspection
Patent
1994-10-20
1996-10-29
Boudreau, Leo
Image analysis
Applications
Manufacturing or product inspection
382142, 382144, 382260, G06K 900
Patent
active
055704310
ABSTRACT:
Quantitative characterization of a crack detection analysis method is achieved by determining the detection sensitivity and background noise produced by the analysis method by suitably processing images obtained from one or more control specimens prepared by the method and subjected to appropriate and optimized conditions of illumination. In addition, the crack detection analysis method is optimized by looking for the parameters which influence the method and determining the value thereof which maximizes detection sensitivity and minimizes background noise.
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Gillard Herve P. R.
Prejean-Lefevre Veronique H. M. P.
Boudreau Leo
Societe Nationale d'Etude et de Construction de Moteurs d'Aviati
Tadayon Bijan
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