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Universal spatial pattern recognition system

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Use of patterned, structured light to detect and measure...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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User interface for quantifying wafer non-uniformities and...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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User interface for wafer data analysis and visualization

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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User interface for wafer data analysis and visualization

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Using time resolved light emission from VLSI circuit devices...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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