Method of testing detection and correction capabilities of...
Optimized computation of first and second divider values for a p
Scheduling of transactions in system-level test program...
Semiconductor apparatus for providing reliable data analysis...
Semiconductor device having ECC circuit
Semiconductor memory having error correction
Semiconductor memory having error correction
System and method for generating real time errors for device...
System and method for verifying error detection/correction...
Systems and methods for scripting data errors to facilitate...
Systems and methods for scripting data errors to facilitate...
Test data pattern for testing a CRC algorithm