I-V Curve tracer employing parametric sampling

Details I-V Curve tracer employing parametric sampling I-V Curve tracer employing parametric sampling

1982-07-26

1984-06-26

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158R, 324158T, G01R 3122

Patent

active

044568800

ABSTRACT:
An I-V curve tracer measures an I-V relationship of an electrical device during transient conditions. In operation, the curve tracer couples across the device a fixed-value inductive or capacitive load. While the current and voltage flowing through the device approach steady-state levels, the voltage and current are sampled and stored in a memory upon predetermined incremental changes in one parameter of the device such as voltage. A digital representation of one parameter, such as voltage, constitutes a memory address and another parameter, such as current, is stored at that address in the memory. A data processor subsequently retrieves the memory data and addresses to display or plot the I-V relationship of the device. This parametric sampling technique assures that the measurements are coincident in occurrence with the sweeping of the I-V curve and eliminates the need for complex control and timing circuits.

REFERENCES:
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patent: 3264563 (1966-08-01), Arnold
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patent: 4129823 (1978-12-01), van der Pool et al.
patent: 4163194 (1979-07-01), Ross
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Cull et al., The DOE/LeRC Photovoltaic Systems Test Facility; NASA, Lewis Research Center, Cleveland, Ohio 44135; 1978.
Cull et al., High Speed Computerized Data Acquisition of Photovoltaic V-I Characteristics; NASA, Lewis Research Center, Cleveland, Ohio, 7-27-1981.

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