IC chip test circuit for high frequency integrated circuits

Details IC chip test circuit for high frequency integrated circuits IC chip test circuit for high frequency integrated circuits

1990-04-06

1992-03-17

Wieder, Kenneth

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 307303, G01R 328, H03R 17693

Patent

active

050972057

ABSTRACT:
In an IC device, an IC body having a predetermined function and high-frequency circuits for testing high-frequency characteristics of the IC body are formed on a single chip. The test circuits include an L-H frequency conversion circuit arranged on the input side of the IC body and an H-L frequency conversion circuit arranged on the output side. The test circuits can switch a connecting state between the conversion circuits and the IC body in response to an external control signal. The test circuits can be disconnected from the IC body after a test is completed.

REFERENCES:
patent: 4278897 (1981-07-01), Ohno et al.
patent: 4697095 (1987-09-01), Fujii
patent: 4899339 (1990-02-01), Shiragaki et al.
patent: 4905240 (1990-02-01), Kimoto
patent: 4905241 (1990-02-01), Schmid et al.
patent: 4912346 (1990-03-01), Mizuta

Affiliated with

Also associated with

Rating

IC chip test circuit for high frequency integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with IC chip test circuit for high frequency integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and IC chip test circuit for high frequency integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1478630