Damage thresholds of p-n junction devices by a current pulse met
Decoupling apparatus for use with integrated circuit tester
Defect leakage screen system
Defect mitigation in display panels
Design for test for a high speed serial interface
Deskew fixture
Detachable high-speed opto-electronic sampling probe
Detecting open ground connections in surface mount connectors
Detecting presence of N+ diffusion faults in a micropackage cont
Detecting structure formed on a PCB to detect unavailability...
Detection of arcing faults in generator windings
Detection of radio frequency emissions
Detection of semiconductor failures by photoemission and electro
Detection of transposition group short circuits in machine windi
Detection of tri-state logic signals
Detector circuit for detecting a phase signal of a polyphase alt
Determination of failure criteria based upon grain boundary elec
Device and a process for the calibration of a semiconductor...
Device and a process for the calibration of a semiconductor...
Device and method for planeness testing