Defect leakage screen system

Details Defect leakage screen system Defect leakage screen system

1985-02-19

1988-01-12

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324258T, 324 73R, G01R 3130

Patent

active

047194189

ABSTRACT:
A test circuit or system is provided wherein data is stored in circuits or cells of an array or matrix with the use of conventional or normal operating voltages. Voltages at internal nodes of the circuits or cells are altered to magnitudes beyond the normal operating ranges, which includes significantly decreasing the offset voltage, for a short period of time and then the stored data is read out at normal voltages and currents and compared with the data written into the circuits or cells.

REFERENCES:
patent: 3795859 (1974-03-01), Benante et al.
patent: 3900838 (1975-08-01), Wiedmann
patent: 3995215 (1976-11-01), Chu et al.
patent: 4004222 (1977-01-01), Gebhard
patent: 4015203 (1977-03-01), Verkuil
patent: 4410816 (1983-10-01), Kanai
patent: 4418403 (1983-11-01), O'Toole et al.
patent: 4459686 (1984-07-01), Toyoda
patent: 4553225 (1985-11-01), Ohe
"Variable Standby Current Source Scheme, by Chan et al, IBM Tech. Disc. Bull., vol. 27, #1A, 6/84, pp. 240-244.

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