LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Measurement system

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Cavitation detection in a process plant

Data processing: measuring – calibrating – or testing – Measurement system – Pressure

Reexamination Certificate

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CBRN attack detection system and method II

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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CDMA signal waveform quality display system, method, and...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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CDMA signal waveform quality display system, method, and...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Centralized diagnostic logging service

Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping

Reexamination Certificate

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Centralized monitoring and early warning operations console

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Chaos index value calculation system

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Chaos index value calculation system

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Character layout method, image forming method and...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination

Reexamination Certificate

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Characteristic extraction apparatus for moving object and...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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Characterization of radio frequency (RF) signals using...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Characterization of radio frequency (RF) signals using...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Characterizing an exposure tool for patterning a wafer

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Characterizing degradation of components during...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Charge process upon effecting predetermined process by using...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Charged particle beam apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Chip temperature monitor using delay lines

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system

Patent

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Chromatic dispersion distribution measurement apparatus and...

Data processing: measuring – calibrating – or testing – Measurement system

Reexamination Certificate

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Chronometric, communication, identification, and tracking tag

Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate

Reexamination Certificate

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Circuit and method for distributing events in an event stream

Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate

Reexamination Certificate

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