Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-03-04
2008-03-04
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S079000
Reexamination Certificate
active
07340381
ABSTRACT:
Embodiments of the present invention apply wavelets to radio frequency (RF) signals to extract specific characteristics (e.g., jitter, phase variations, frequency variations) so that their timing, phase, and frequency components can be characterized. In one embodiment of the present invention, a Haar wavelet is used to extract timing characteristics. In another embodiment, a Morlet wavelet is used to extract phase characteristics. In still another embodiment, a Morlet wavelet is used to extract frequency characteristics.
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Haileselassie Welela
Soma Mani
Yan Jessica
Blakely , Sokoloff, Taylor & Zafman LLP
Bui Bryan
University of Washington
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