Chip temperature monitor using delay lines

Details Chip temperature monitor using delay lines Chip temperature monitor using delay lines

1997-08-19

1999-03-30

Arana, Louis

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

702132, 326 50, 326121, 324760, 324765, 36452834, G06F 1740

Patent

active

058901000

ABSTRACT:
A temperature monitor which determines the operating temperature of an integrated circuit chip. The temperature monitor includes a delay line made up of serially connected delay cells. The propagation time of a signal through the delay cells is determined and this value is correlated to a signal representative of chip temperature. Chip temperature values are stored in a memory to produce an operating history of chip temperatures.

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