Systems and methods for LBIST testing using multiple...

Details Systems and methods for LBIST testing using multiple... Systems and methods for LBIST testing using multiple...

2007-12-11

2007-12-11

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S738000

Reexamination Certificate

active

11096787

ABSTRACT:
Systems and methods for performing logic built-in-self-tests (LBISTs) in digital circuits, where the LBIST circuitry is configured to propagate data through different portions of the functional logic of the circuits at different times. In one embodiment, a logic circuit incorporates LBIST components including a set of scan chains interposed between portions of the functional logic. Pseudorandom bit patterns are scanned into the scan chains so that they can be propagated through the functional logic following the scan chains. The resulting bit patterns are captured in scan chains following the functional logic and then scanned out of these scan chains. An LBIST controller causes functional operations in different portions of the functional logic to be performed at different times during a functional phase of a test cycle. The functional operations may be performed at a normal operating speed, while scan shift operations may be performed at a lower speed.

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