Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Inventor
active
Circuit apparatus and method for testing integrated circuits...
Method and apparatus for accelerating through-the pins LBIST...
Method and apparatus for testing a ring of non-scan latches...
Multi-test method for using compare MISR
Programmable scan shift speed control for LBIST
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Profile ID: LFUS-PAI-P-2430234