Built off self test (BOST) in the kerf

Details Built off self test (BOST) in the kerf Built off self test (BOST) in the kerf

2007-05-15

2007-05-15

Kerveros, James C (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S765010

Reexamination Certificate

active

10154476

ABSTRACT:
A semiconductor device includes an integrated main circuit and an auxiliary circuit on a semiconductor substrate. The auxiliary circuit is configured to output and/or for receive electrical signals to and/or from the main circuit and is arranged at a distance from the main circuit in a kerf region of the semiconductor device. The main and auxiliary circuits each include a contact device that can be externally contact-connected to produce a temporary electrical signal connection between the main and auxiliary circuits.

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