4. Coded data generation or conversion
  5. Digital code to digital code converters
  6. Programmable structure

Alan Morgan

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Addressing device for selecting regular and redundant elements

Coded data generation or conversion – Digital code to digital code converters – Programmable structure
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Built off self test (BOST) in the kerf

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor memory with jointly usable fuses

Static information storage and retrieval – Read/write circuit – Testing
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Test system and method for testing memory circuits

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Wafer with additional circuit parts in the kerf area for...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Profile ID: LFUS-PAI-P-2712235

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