Fin structure formation

Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S153000, C438S154000, C438S396000, C438S584000, C257S350000, C257S351000, C257S401000, C257S284000, C257S413000

Reexamination Certificate

active

11338464

ABSTRACT:
A method for forming fin structures is provided. Sacrificial structures are provided on a substrate. Fin structures are formed on the sides of the sacrificial structures. The forming of the fin structures comprises a plurality of cycles, wherein each cycle comprises a fin deposition phase and a fin profile shaping phase. The sacrificial structure is removed.

REFERENCES:
patent: 5716884 (1998-02-01), Hsue et al.
patent: 2001/0034114 (2001-10-01), Liaw
patent: 2006/0022262 (2006-02-01), Yoon et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fin structure formation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fin structure formation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fin structure formation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3763587

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.