Top antireflective coating film

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

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430324, 428421, G03F 700

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active

060570806

ABSTRACT:
Enhanced fidelity of pattern transfer of aqueous developable photoresist compositions is achieved with top antireflective coatings which are fluorine-containing and have a refractive index approximately equal to the square root of the underlying photoresist and which are removable in the developer for the photoresist.

REFERENCES:
patent: 3882067 (1975-05-01), Petrella
patent: 4555543 (1985-11-01), Effenberger et al.
patent: 4557977 (1985-12-01), Memmer et al.
patent: 4670503 (1987-06-01), Neumann et al.
patent: 4701390 (1987-10-01), Grunwald et al.
patent: 4719146 (1988-01-01), Hohage et al.
patent: 4759990 (1988-07-01), Yen
patent: 4933388 (1990-06-01), Blickle et al.
T. Tanaka, et al., J. Electrochem. Soc., 137 pp. 3900-3905 (1990) A New Photolithography Technique with Antireflective Coating on Resist: ARCOR.
T. Tanaka, et al., J. Appl. Phys. 67, 2617-22 (1990), "A New Method for Reflectivity Measurement at the Interface between Resist and Substrate".
T. Tanaka, et al., Chem Abs., 107:87208y (1987), "Photolithography".

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