4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Current driver

Yu-Chang Lin

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Apparatus and method for testing conductive bumps

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Devices and methods for detecting current leakage between...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Devices for detecting current leakage between deep trench...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Devices for detecting current leakage between deep trench...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Embedded memory control circuit for control of access operations

Static information storage and retrieval – Addressing – Plural blocks or banks
Patent

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Profile ID: LFUS-PAI-P-652887

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