Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-27
2008-10-21
Nguyen, Ha (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07439751
ABSTRACT:
An apparatus and method for testing conductive bumps are provided. An exemplary embodiment of a bump testing unit comprises a support substrate with two probes protruding one surface thereof. A digital detecting device is embedded in the support substrate, comprising a first and second input terminals and an output terminal, wherein the input terminals electrically connects one of the probes.
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Kuo Yian-Liang
Lin Yu-Chang
Lin Yu-Ting
Birch Stewart Kolasch & Birch, LLP.
Isla Rodas Richard
Nguyen Ha
Taiwan Semiconductor Manufacturing Co Ltd.
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