4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Yoshitaka Kamo

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Electric contact device for establishing an improved contact...

Electrical connectors – Coupling part having handle or means to move contact... – Expandable – prong receiving socket
Reexamination Certificate

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Field effect transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate

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Semiconductor device including a transparent semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Plural recrystallized semiconductor layers
Reexamination Certificate

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Test method of chips in a semiconductor wafer employing a test a

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1354650

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