Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate
2007-09-24
2010-12-14
Gurley, Lynne A (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Junction field effect transistor
C257S267000, C257SE27068, C257SE21047
Reexamination Certificate
active
07851831
ABSTRACT:
A transistor includes a nitride semiconductor layer and a gate electrode layer. The gate electrode layer includes a tantalum nitride layer on the nitride semiconductor layer. The tantalum nitride layer forms a Schottky junction with the nitride semiconductor layer. The transistor also includes an insulating film on the nitride semiconductor layer. The insulating film surrounds the gate electrode layer. A first portion of the gate electrode layer, in contact with the nitride semiconductor layer, has a higher nitrogen mole fraction than a second portion of the gate electrode layer.
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Kamo Yoshitaka
Koyama Hidetoshi
Shiga Toshihiko
Gurley Lynne A
Leydig , Voit & Mayer, Ltd.
Mitsubishi Electric Corporation
Yushina Galina
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