4. Electricity: measuring and testing
  5. Plural, automatically sequential tests

Yasumasa Nishimura

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Redundancy-secured semiconductor device

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Semiconductor device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Semiconductor device having a fuse layer

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Patent

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Semiconductor device, test method for semiconductor device,...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Profile ID: LFUS-PAI-P-1101692

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