Semiconductor device

Details Semiconductor device Semiconductor device

1985-05-28

1987-06-09

Popek, Joseph A.

Static information storage and retrieval

Read/write circuit

Testing

365189, G11C 700

Patent

active

046725822

ABSTRACT:
A semiconductor device is provided which can be efficiently subjected to a function test at a high speed by write/read operations for each plurality of bits. The semiconductor device according to the present invention comprises an encoder for encoding a 1-bit signal to a signal of a plurality of bits and a decoder receiving a signal of a plurality of bits for decoding the same to a 1-bit signal in response to the states thereof, so as to simultaneously write each bit of the plurality of bits from the encoder in each corresponding memory cell of a plurality of simultaneously selected memory cells in a writing test mode, and to simultaneously read information signals stored in the plurality of simultaneously selected memory cells in a reading test mode thereby to decode the signals to a 1-bit signal corresponding to the plurality of information signals.

REFERENCES:
patent: 4464750 (1984-08-01), Tatematsu
patent: 4541090 (1985-09-01), Shiragasawa
"A Programmable 265K CMOS EPROM with On-Chip Test Circuits", by S. Tanaka et al, ISSCC 84/Thurs., Feb. 23, 1984.

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