Redundancy-secured semiconductor device

Details Redundancy-secured semiconductor device Redundancy-secured semiconductor device

1985-08-29

1988-01-12

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

340653, G01R 3128, G08B 2900

Patent

active

047194103

ABSTRACT:
A redundancy-secured semiconductor device, comprising: primary semiconductor elements and secondary semiconductor elements, the secondary elements being spare, redundant elements for performing the functions of the primary elements that may contain faults. The primary elements are selectively disabled if a fault is found during a redundancy test and a secondary element is substituted therefor. The substituted secondary element is then tested for performance criteria at the time of the redundancy test.

REFERENCES:
patent: 4215340 (1980-07-01), Lejon
"Session XII: Dynamic Memories" by Ronald P. Cenker, et al, Digest of Technical Papers 1979 IEEE, pp. 150-151, 290.
"Session VIII: Memories and Redundancy Techniques" by Kim Kokkonen et al, Digest of Technical Papers, 1981 IEEE, pp. 80-81.

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