4. Static structures (e.g., buildings)
  5. Processes
  6. Column, mast, etc., construction

William E. Alford

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Apparatus for scan testing of integrated circuits with scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Automatic placement of decoupling capacitors

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Constraint based retiming of synchronous circuits

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate

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Hierarchical analog layout synthesis and optimization for...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Integrated circuit design systems for replacing flip-flops...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing
Reexamination Certificate

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