4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Weng Fook Lee

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Address sequencer within BIST (Built-in-Self-Test) system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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High-speed hexadecimal adding method and system

Electrical computers: arithmetic processing and calculating – Electrical digital calculating computer – Particular function performed
Reexamination Certificate

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I/O partitioning system and methodology to reduce...

Static information storage and retrieval – Floating gate – Particular biasing
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Implementing reference current measurement mode within...

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Method and apparatus for pre-charging negative pump MOS...

Static information storage and retrieval – Read/write circuit – Precharge
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Profile ID: LFUS-PAI-P-2126928

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