4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Vivek Chickermane

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Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
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Distributed test compression for integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus to use physical design information to...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method and mechanism for implementing electronic designs...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Scan testing architectures for power-shutoff aware systems

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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