4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

United Semiconductor Circuit Corp.

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Method for measuring the kink effect of a semiconductor device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method of forming capacitors

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Patent

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Method of nitride-sealed oxide-buffered local oxidation of silic

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Recessed oxide by localized oxidation
Patent

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Method to grow self-aligned silicon on a poly-gate, source and d

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Patent

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