Method to grow self-aligned silicon on a poly-gate, source and d

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438303, 438299, 438592, 438630, 438649, 438647, 438651, 438655, 438657, 438664, 438682, 438684, H01L 21283

Patent

active

059982861

ABSTRACT:
The method of the present invention includes forming a MOS on a semiconductor substrate. Subsequently, a silicon-rich metal silicide layer is deposited on the MOS and substrate by using chemical vapor deposition to act as a silicon material source. Then, a thermal process is carried out to separate a portion of the silicon out of the metal silicide layer, thereby forming a silicon layer on top of the gate of the MOS, source/drain. The nest step is to remove the metal suicide layer. A self-aligned metal silicide layer is formed on the silicon layer.

REFERENCES:
patent: 4701349 (1987-10-01), Koyanagi et al.
patent: 4974056 (1990-11-01), Brodsky et al.
patent: 4983544 (1991-01-01), Lu et al.
patent: 5138432 (1992-08-01), Stanasolovich et al.
patent: 5217923 (1993-06-01), Suguro
patent: 5665646 (1997-09-01), Kitano
patent: 5679585 (1997-10-01), Gardner et al.
patent: 5759899 (1996-01-01), Saito
patent: 5830775 (1996-11-01), Maa et al.
patent: 5851921 (1997-04-01), Gardner et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method to grow self-aligned silicon on a poly-gate, source and d does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method to grow self-aligned silicon on a poly-gate, source and d, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method to grow self-aligned silicon on a poly-gate, source and d will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-823121

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.