4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Toshikazu Tsutsui

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Apparatus for analyzing a failure in a semiconductor wafer and m

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Failure analysis method and device

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Failure analyzer

Boots – shoes – and leggings
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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead
Patent

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System for analyzing a failure in a semiconductor wafer by calcu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Profile ID: LFUS-PAI-P-796691

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