4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Toshikazu Kitajima

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Film thickness measuring method, relative dielectric...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate

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Insulator film characteristic measuring method and insulator...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method and apparatus for measuring relative dielectric constant

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Method and apparatus for measuring relative dielectric constant

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Method and apparatus for measuring thickness of thin film...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2392923

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