4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Tomomi Momohara

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Method for testing semiconductor memory devices, and apparatus a

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Method for testing semiconductor memory devices, and...

Semiconductor device manufacturing: process – Repair or restoration
Reexamination Certificate

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Method for testing semiconductor memory devices, and...

Semiconductor device manufacturing: process – Repair or restoration
Reexamination Certificate

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Probe card having groups of probe needles in a probing test appa

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Probe card having groups of probe needles in a probing test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reissue Patent

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Profile ID: LFUS-PAI-P-181270

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