4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Tokuya Osawa

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Apparatus for testing semiconductor integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Memory test circuit

Excavating
Patent

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Scan path forming circuit

Excavating
Patent

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Semiconductor device which transmits or receives a signal to...

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Semiconductor integrated circuit device with fault analysis...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-381256

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