4. Excavating

Takahisa Hiraide

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Device and method for testing integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Integrated circuit and method for testing the circuit

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Test pattern preparation system

Excavating
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Testing apparatus and testing method for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Testing apparatus and testing method for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-913249

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