Test pattern preparation system

Details Test pattern preparation system Test pattern preparation system

1997-03-20

1998-09-29

Tu, Trinh L.

Excavating

395500, 39518309, 364578, G01R 3128, G06F 1100, G06F 300, G06G 748

Patent

active

058155139

ABSTRACT:
A test pattern preparation system for testing an LSI circuit, the system includes: a circuit data file for storing various circuit data; an old test pattern file for storing old test patterns; a test pattern preparation unit for performing a logic simulation, detecting "simultaneous-change action" based on a result of the logic simulation, and preparing a new test pattern in accordance with the circuit data and the old test patterns; and a new test pattern file for storing new test patterns which are prepared by the test pattern preparation unit.

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