4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Bulk effect device
  6. Bulk effect switching in amorphous material

Simone Raoux

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Amorphous nitride release layers for imprint lithography,...

Plastic and nonmetallic article shaping or treating: processes – Mechanical shaping or molding to form or reform shaped article – Deforming the surface only
Reexamination Certificate

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Current constricting phase change memory element structure

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Current constricting phase change memory element structure

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Indirect switching and sensing of phase change memory cells

Optics: measuring and testing – Refraction testing – Prism engaging specimen
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Method and structure for high performance phase change memory

Static information storage and retrieval – Systems using particular element – Resistive
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Profile ID: LFUS-PAI-P-2211784

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