Method and structure for high performance phase change memory

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S157000, C365S158000

Reexamination Certificate

active

11150188

ABSTRACT:
A method (and structure) for a memory cell having a phase change material (PCM) element and a heating element external to the PCM element. The heating element causes one of a presence of and an absence of a phase boundary within the PCM element for storing information in the PCM element.

REFERENCES:
patent: 4586164 (1986-04-01), Eden
patent: 5166758 (1992-11-01), Ovshinsky et al.
patent: 6828081 (2004-12-01), Chen et al.
patent: 6859389 (2005-02-01), Idehara
patent: 6891747 (2005-05-01), Bez et al.
patent: 7110286 (2006-09-01), Choi et al.
patent: 2002/0131309 (2002-09-01), Nishihara et al.
Young-Tae Kim, et al. “Study on Cell Characteristics of PRAM using the Phase -Change Simulation”, 0-7803-7826-1/03 IEEE, pp. 211-214, 2003.
Stefan Lai, et al. “OUM-A 180 nm Nonvolatile Memory Cell Element Technology For Stand Alone and Embedded Applications”, IEDM Tech. Dig., pp. 36.51-36.54, 2001.
Jon Maimon, et al. “Chalcogenide-Based Non-Volatile Memory Technology”, IEEE Aerospace Conf. Proc., pp. 5-2289-5-2294, 2001.
Scott Tyson, et al. “Nonvolatile, High Density, High Performance Phase-Change Memory”, IEEE Aerospace Conf. Proc., pp. 385-390, 2000.
C.A. Volkert, et al. “Modeling of Laser Pulsed Heating and Quenching in Optical data Storage Media”, Journal of Applied Physics, vol. 86, No. 4, pp. 1808-1816, 1999.
Chubing Peng, et al. “Experimental and Theoretical Investigations of Laser-Induced Crystallization and Amorphization in Phase-Change Optical Recording Media”, Journal of Applied Physics, pp. 4183-4191, 1999.
Meikei Ieong, et al. “Silicon Device Scaling to the Sub-10nm Regime” Science vol. 306, pp. 2057-2060, 2005.
K.W. Schlichting, et al. “Thermal Conductivity of Dense and Porous”, J. Materials Science, vol. 36, pp. 3003-3010, 2001.
“Applied Thin Films, Inc.”, http://www.atfinet.com/tbc—main.htm, 2004, pp. 1-2.
Jie Wu, et al. “Thermal Conductivity of Ceramics in the ZrO2-GdO1.5 Systems” J. Materials Research, vol. 17, No. 12, pp. 3193-3200, 2002.
C. J. Tymczak, et al. “Asymmetric Crystallization and Melting Kinetics in Sodium: A Molecular-Dynamics Study”, 1990 The American Physical Society, vol. 64, No. 11, pp. 1278-1281.
S. Privitera, et al., “Amorphous-to-Polycrystal Transition in GeSb TeThin Films”, Materials Research Science Symp. Proc., vol. 803, pp. HH1.4.1-HH1.4.6, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and structure for high performance phase change memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and structure for high performance phase change memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and structure for high performance phase change memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3805931

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.