Efficient storage of fail data to aid in fault isolation

Details Efficient storage of fail data to aid in fault isolation Efficient storage of fail data to aid in fault isolation

2004-07-01

2009-12-15

Mehta, Bhavesh M (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C438S014000

Reexamination Certificate

active

07634127

ABSTRACT:
A method and system for fault isolation in semiconductor with devices thereon includes determining test data from a plurality of semiconductor devices and creating a failure bitmap of locations of the plurality of semiconductor devices and test data in a vector graphic CAD format. The vector graphic CAD format allows storage of test data on multiple layers.

REFERENCES:
patent: 3830717 (1974-08-01), Singer et al.
patent: 5475695 (1995-12-01), Caywood et al.
patent: 5515453 (1996-05-01), Hennessey et al.
patent: 5872862 (1999-02-01), Okubo et al.
patent: 6137295 (2000-10-01), Yoshida
patent: 6292582 (2001-09-01), Lin et al.
patent: 6330053 (2001-12-01), Takayama
patent: 6333992 (2001-12-01), Yamamura et al.
patent: 6396945 (2002-05-01), Ishii
patent: 6456951 (2002-09-01), Maeda et al.
patent: 6483938 (2002-11-01), Hennessey et al.
patent: 6487307 (2002-11-01), Hennessey et al.
patent: 6539106 (2003-03-01), Gallarda et al.
patent: 6577757 (2003-06-01), DeYong et al.
patent: 6868175 (2005-03-01), Yamamoto et al.
patent: 2001/0053243 (2001-12-01), Norioka et al.
patent: 2002/0100872 (2002-08-01), Hiroi et al.
patent: 2002/0168098 (2002-11-01), DeYong et al.
patent: 2003/0016858 (2003-01-01), DeYong et al.
patent: 2003/0050761 (2003-03-01), Okabe et al.
patent: 2003/0053677 (2003-03-01), DeYong et al.
patent: 2003/0058436 (2003-03-01), Ono et al.
patent: 2003/0067496 (2003-04-01), Tasker et al.
patent: 2003/0076989 (2003-04-01), Maayah et al.
patent: 2003/0228049 (2003-12-01), Asai
patent: 2003/0228050 (2003-12-01), Geshel et al.
patent: 2004/0121496 (2004-06-01), Brankner et al.

Affiliated with

Also associated with

Rating

Efficient storage of fail data to aid in fault isolation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Efficient storage of fail data to aid in fault isolation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Efficient storage of fail data to aid in fault isolation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4113517