Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-29
2006-08-29
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C324S522000, C324S765010
Reexamination Certificate
active
07099789
ABSTRACT:
A method and system of processing tester information of a system under test is provided. Data of a tested characteristic of the system under test is generated. A distribution curve is extracted from the data. A signature of the distribution curve is determined, and a map of the signature on a depiction of the system under test is presented. The distribution curve also can be categorized in a plurality of bins, and bitmaps are generated for the sections in each of the plurality of bins. Systematic signatures are determined from the bitmaps in the block, and the signatures are correlated with the locations on the system under test.
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Khubchandani, R. “A Fast Test to Generate Flash Memory Threshold Voltage Distribution Map”, Aug. 9-10, 1999 IEEE International Workshop on Memory Technolgoy, Design and Testing, San Jose, CA, USA pp. 78-82.
Erhardt Jeffrey P.
Shetty Shivananda S.
Steffan Paul J.
Tsiang Jerry H. G.
Wang John J.
Advanced Micro Devices , Inc.
Barbee Manuel L
Hoff Marc S.
Ishimaru Mikio
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