4. Dynamic magnetic information storage or retrieval
  5. Head
  6. Head surface structure

Satoshi Tomimatsu

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Apparatus and method for observing sample using electron beam

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Apparatus and method for specimen fabrication

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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Apparatus for detecting defect in device and method of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus for inspecting defects of devices and method of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus for specimen fabrication and method for specimen...

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Profile ID: LFUS-PAI-P-1615096

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