4. Data processing: structural design, modeling, simulation, and em
  5. Simulating electronic device or electrical system

Sani R. Nassif

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Characterization array and method for determining threshold...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Characterization circuit for fast determination of device...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Circuit for computing moment pre-products for statistical...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
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Closed-loop modeling of gate leakage for fast simulators

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system
Reexamination Certificate

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Delay-based bias temperature instability recovery...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Profile ID: LFUS-PAI-P-2213718

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